\begin{thebibliography}{1}

\bibitem{Gloster93.02}
{C. Gloster and F. Brglez}.
\newblock {Synthesis of Weighted Random Test Sequences with Application to
  Testing of Sequential Circuits}.
\newblock In {\em European Conf. on Design Automation (EDAC'93)}, pages
  231--237, Feb. 1993.

\bibitem{Gloster92.09}
{C. Gloster and F. Brglez}.
\newblock {Cellular Scan Test Generation for Sequential Circuits}.
\newblock In {\em European Design Automation Conference (EURO-DAC '92)}, pages
  530--536, September 1992.

\bibitem{Gloster93.03}
C.~Gloster.
\newblock {\em {Dynamic Scan Testing: A New Paradigm}}.
\newblock PhD thesis, North Carolina State University, Raleigh, NC, March 1993.
\newblock {Also published as: MCNC Technical Report TR93-06, Dynamic Scan
  Testing: Investigating a New Design Paradigm, Microelectronics Center of
  North Carolina, Research Triangle Park, N.C., April 1993.}

\end{thebibliography}
